Two DMM7510s built into one compact enclosure
DMM7512´Â ±âÁ¸ÀÇ 7¨ö Digits DMM7510 µðÁöÅÐ ¸ÖƼ¹ÌÅÍ(DMM)¿¡¼ ¸î °¡Áö ÃøÁ¤ ±â´ÉÀ» Á¦°ÅÇÑ DMM7510 2´ë·Î ±¸¼ºµÇ¾îÀÖ½À´Ï´Ù. DMM7512 ¸ÖƼ¹ÌÅÍ´Â DMM7510°ú µ¿ÀÏÇÑ Á¤È®µµ, ¹Î°¨µµ ±×¸®°í ¼Óµµ¸¦ Á¦°øÇÕ´Ï´Ù. ÀÌ·Î½á ¼Õ½±°Ô ±âÁ¸ÀÇ DMM7510ÀÌ »ç¿ëµÈ Å×½ºÆ® ½Ã½ºÅÛ¿¡ ÅëÇÕÇÒ ¼ö ÀÖ½À´Ï´Ù.
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- Sample complex waveforms with the 1Msample/s, 18-bit digitizer; store up to 27.5 million readings
- Test components used in low power circuits with 0.1 §Ù and 1 pA sensitivities
- Maximize test quality with high test uncertainty ratios using 1-year accuracy DC volts as good as 14 ppm
- Built-in Test Script Processor (TSP¢ç) enables test sequence execution without controller interaction, reducing test time and communication overhead, while availing the controller for other tasks
Double Test System Density
1UÀÇ ·¢ °ø°£¿¡ µÎ ´ëÀÇ DMMÀÌ ÀÖ¾î ·¢ °ø°£À» Àý¾àÇØ ÁÝ´Ï´Ù. Áï, 2U ³ôÀÌÀÇ DMM7510 µÎ ´ë¿Í ºñ±³Çغ¼ ¶§, ±× Àý¹Ý¿¡ ÇØ´çÇÏ´Â °ø°£¿¡¼ µÎ ¹èÀÇ ÃøÁ¤ ±â´ÉÀ» ¾òÀ» ¼ö ÀÖ½À´Ï´Ù.
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- ÄÄÆÑÆ®ÇÑ 2U ·¢ °ø°£¿¡ 2606B °í¹Ðµµ, 4ä³Î SMU(¼Ò½º ÃøÁ¤ ÀåÄ¡) ¹× DMM7512(¼Ò½Ì ä³Î 4°³/ÃøÁ¤ ä³Î 2°³)¿Í ¼Ò½Ì/ÃøÁ¤ ±â´ÉÀ» °áÇÕ
- ¼¸Ö ¸Å´ÏÁö¸ÕÆ®(¿ °ü¸®)¸¦ À§ÇÑ Ãß°¡ °ø°£ÀÌ DMM7512 ¶Ç´Â 2606B »çÀÌ¿¡ ÇÊ¿äÇÏÁö ¾ÊÀ½
Significantly Reduce Test Time
°¢ DMM7512¿¡ ÀÖ´Â µÎ ´ëÀÇ DMMÀº ³»Àå ÀÎÅÚ¸®Àü½º ±â´ÉÀ» °®Ãç TSP¢ç(Å×½ºÆ® ½ºÅ©¸³Æ® ÇÁ·Î¼¼¼) ±â¼úÀ» »ç¿ëÇØ PC·Î »óÈ£ ÀÛ¿ëÇÏÁö ¾Ê°íµµ Å×½ºÆ® ÇÁ·Î±×·¥À» ½ÇÇàÇÒ ¼ö ÀÖ½À´Ï´Ù. ¶ÇÇÑ °¢°¢ÀÇ DMMÀº TSP-Link¢ç Çϵå¿þ¾î ÀÎÅÍÆäÀ̽º¸¦ Á¦°øÇÏ¿© ÇÑ Àåºñ¿¡¼ ¸¶½ºÅÍ-Á¾¼Ó ±¸¼ºÀÇ ´Ù¸¥ Àåºñ¸¦ Á¦¾îÇÒ ¼ö ÀÖ½À´Ï´Ù.
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- TSP-Link Å×½ºÆ® ½Ã½ºÅÛ¿¡ ÀÖ´Â Àåºñ ÃÖ´ë 32´ë Á¦¾î
- 500ns ¹Ì¸¸ Áö¿¬ ½Ã°£(latency)À¸·Î ÃøÁ¤ µ¿±âÈ
- Àåºñ¿Í PC °£ÀÇ ½Ã°£ ¼Ò¸ðÀûÀÎ Åë½Å Á¦°Å
- DMM7512 TSP Äڵ尡 DMM7510 TSP ÄÚµå¿Í ȣȯ